ZOIX 3.1: Delivering Efficient Transient Fault Support and Waveform Viewing

By CIOReview | Tuesday, February 23, 2016
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ROSEVILLE, MN:  A recent announcement by WinterLogic, Inc., the industry leader in EDA fault simulation, revealed new add-ons to their solution featuring Z01X 3.1 with transient fault model support and waveform viewing.

The additions will create a powerful, robust solution for complex injection campaigns involving thousands to millions of faults, necessary to meet the standards of ISO 26262. Transient faults may represent many of the random hardware failure types defined in ISO 26262. 

Essentially, ZOIX 3.1 provides two different fault model types for transient faults. The transient toggle model performs a bit flip at the cycle time specified by inverting the good machine value. Similarly, instead of toggling the value, the fault in the transient one/zero model is set to a 0 or a 1 as specified. Both models are available for single or multiple fault origins and will set or deposit the fault for any duration as specified by the user.

In addition, the Inspect 3.1 waveform viewer allows users to effectively analyze fault effects by simultaneously viewing both good and faulty behaviors. Both transient toggle and transient one/zero faults are natively supported by the waveform viewer for effective debugging.

“Over a year ago YOGITECH, the leading EDA and service provider of ISO 26262 solutions, integrated Z01X into their Safety Verifier solution. Today we are very pleased to say that Z01X is the only concurrent fault simulator to offer both transient and stuck-at fault support, which we believe will be a necessary component of future automotive safety applications,” says Brian Davenport, Product Manager, Safety and Security Verification.

“As the only event-driven fault simulator on the market, Z01X is capable of injecting thousands of faults in a single thread, allowing speed-up of at least 100X compared to sequential and parallel solutions,” says Olivier Bolon, Director of Sales and Business Development. “This is the key to fast design iterations and engineering productivity.”